Power semiconductors
Reliability and qualification work on SiC and IGBT devices.
Who buys this: Device makers, research groups and the compound semiconductor cluster.
Why it matters now
Britain has a real concentration of compound semiconductor work, and the test problem it creates is not primarily a power problem.
What the work actually involves
Qualification here means long unattended runs producing data somebody else will audit. The hard parts are sequencing, safe failure and logging that stays legible after the person who set it up has moved on — a software and records problem wrapped around a power supply. This site cites no British standard for it because there is no British standard to cite; the applicable qualification documents are international, and we would rather say so than dress one up.
Assessed against
No British standard is cited for this sector, because there is not one to cite — the applicable qualification documents are international. We would rather say so than dress one up as a national requirement.
Systems we build for it
- SemTest semiconductor reliability ATE
Reliability and characterisation test for power semiconductors.
- Accelerated life and burn-in systems
Environmental stress screening and life test.
Equipment it usually needs
- EL97xx series electronic loadsIntepro own design
150 W – 6000 W and above · 0–500 V sink rating
- AN236 high-power DC electronic loadSupplied and integrated
2 kW – 60 kW per unit · 0–150 V, 0–600 V or 0–1200 V by class · 0–80 A to 0–2400 A · 54 models
Talk it through
Tell us the standard and the device under test. That is enough for an engineer to answer usefully instead of sending a brochure.