Equipment · Test systems and software
SemTest power semiconductor reliability ATE
Intepro own designReliability and qualification test equipment for power semiconductors — SiC and IGBT devices in particular.
- Envelope
- to 1200 V · to 1000 A · to 20 kW total dissipated
- Manufactured by
- Intepro
- Family
- SemTest
- Availability in the UK
- Intepro own design
Why it matters here
British power-electronics research and the compound semiconductor cluster in South Wales are the obvious users. Qualification here means long unattended runs with data an assessor will accept, which is a software and logging problem as much as a power one.
Built into a delivered system, this appears as SemTest semiconductor reliability ATE.
Get a figure against your requirement
Tell us the standard you are assessed against and the device under test. That is enough for an engineer to answer usefully rather than send a brochure.
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